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TESTED DEVICE®
Report No.![]() ![]() | Manufacturer![]() ![]() | Product Name![]() ![]() | Subject of Test (Result)![]() ![]() |
---|---|---|---|
HA 1201-587 | Hamilton Bonaduz AG | Workstation Microlab STAR | Computational Fluid Dynamics (CFD) Expertise Particle emission (VDI 2083 part 9.1) Particle per wafer and pass (PWP) |
Filters
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Suitable for use in cleanroom areas of air cleanliness class ... according to ISO 14644-1*
Subject Of Test
- All (3 Hits)
- Computational Fluid Dynamics (CFD) (1 Hits)
-
Expertise (1 Hits)
- Particle emission (VDI 2083 part 9.1) (3 Hits)
- Particle per wafer and pass (PWP) (1 Hits)
Categories
- All (6 Hits)
- Cleanroom Facilities (1 Hits)
- Automation Components (3 Hits)
- Working Place and Operator (2 Hits)