TESTED DEVICE®

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Company

Sieghard Schiller GmbH & Co.KG
 
Pfullinger Str. 58
72820 Sonnenbühl-Genkingen

Contact Person

Mr. Stefan Huttelmaier
Phone +49-7128 386-343
Email stefan.huttelmaier@schiller-automation.com
Website www.schiller-automation.com

Test Object

Silicon vs. PEEK (conductive)
Material pairing CSM II 35
Silizium vs PEEK (leitfähig)
Q-Id SI 0107-379
Year 2001
Comments
Category Cleanroom Facilities

Tests And Results

Subject of Test Parameter Assessment for / Results Documents
(valid to)
Particle emission (VDI 2083 part 17) Ball-on-disc test
single measuring track 170 mm
velocity 100 mm/s
normal forces 10 N
DIN EN ISO 14644-1 / ISO Class 5
US FED 209E / US Class 100
/
certificate 1 de
statement 1 de
Particle emission (VDI 2083 part 17) Ball-on-disc test
single measuring track 240 mm
velocity 100 mm/s
normal forces 15 N
DIN EN ISO 14644-1 / ISO Class 5
US FED 209E / US Class 100
/
certificate 1 de
statement 1 de
Particle emission (VDI 2083 part 17) Ball-on-disc test
single measuring track 220 mm
velocity 100 mm/s
normal forces 13 N
DIN EN ISO 14644-1 / ISO Class 5
US FED 209E / US Class 100
/
certificate 1 de
statement 1 de